nouvelle_mesure_pcb_fin_cern
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nouvelle_mesure_pcb_fin_cern [2017/12/18 09:46] acqilc [Measured distance at different HV applied] |
nouvelle_mesure_pcb_fin_cern [2021/07/10 23:21] (current) |
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| ===== New analysis ===== | ===== New analysis ===== | ||
| + | ==== Efficiency studies ==== | ||
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| ^Run ^ HV applied ^ HV eff ^ N trigger ^ N strip ^ N 2 Strip ^ $\epsilon$ (%) ^ d$\epsilon$ ^$\epsilon_2$ (%) ^ d$\epsilon_2$ ^ <$\Delta T $> ^ $\sigma \Delta T$ ^ | ^Run ^ HV applied ^ HV eff ^ N trigger ^ N strip ^ N 2 Strip ^ $\epsilon$ (%) ^ d$\epsilon$ ^$\epsilon_2$ (%) ^ d$\epsilon_2$ ^ <$\Delta T $> ^ $\sigma \Delta T$ ^ | ||
| |738747|6600|6832|1077|405|263|37.60| 1.48|24.42| 1.31|-0.59|0.653| | |738747|6600|6832|1077|405|263|37.60| 1.48|24.42| 1.31|-0.59|0.653| | ||
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| + | <imgcaption cern_eff_hveffn| Efficiency curve from previous runs in function of effective HV. Blue is strip efficiency, yellow (X,Y) efficiency > | ||
| {{ :cern_dec_2017:scan_cern_newananlys.png |}} | {{ :cern_dec_2017:scan_cern_newananlys.png |}} | ||
| + | </imgcaption> | ||
| ==== Measured distance at different HV applied==== | ==== Measured distance at different HV applied==== | ||
nouvelle_mesure_pcb_fin_cern.1513590379.txt.gz ยท Last modified: 2021/07/10 23:20 (external edit)
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